Microcosmic analysis of U-I characteristic of ZnO pressure-sensitive ceramics

Gaodianya Jishu/High Voltage Engineering

Volumn 33, Issue 4, 2007, Pages 33-37

  Chen, Xin Gang ^a   Li, Fan ^b   Sang, Jian Ping ^c  

^a CHONGQING UNIVERSITY OF TECHNOLOGY   (China)

^b XI'AN JIAOTONG UNIVERSITY   (China)

^c China National Center for Quality Supervision and Test of Insulators and Surge Arresters   (China)

Author keywords

Deep level transient spectroscopy; Electron microscopy; Electronic trap; Grain boundary barrier; Microcosmic analysis; U I characteristic; ZnO pressure sensitive ceramics

Indexed keywords

EID: 34249850418     PISSN: 10036520     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (17)