Structure of the nanoscience and nanotechnology instrumentation literature

Current Nanoscience

Volumn 3, Issue 2, 2007, Pages 135-154

  Kostoff, Ronald N ^a   Koytcheff, Raymond G ^a   Lau, Clifford G Y ^b  

^a OFFICE OF NAVAL RESEARCH   (United States)

^b INSTITUTE FOR DEFENSE ANALYSES   (United States)

Author keywords

AFM; Information technology; Nanoscience; Nanotechnology; SEM; STM; TEM; Text mining; XRD

Indexed keywords

INFORMATION RETRIEVAL; INFORMATION TECHNOLOGY; NANOSCIENCE; SCANNING ELECTRON MICROSCOPY; TEXT PROCESSING; TRANSMISSION ELECTRON MICROSCOPY; X RAY DIFFRACTION ANALYSIS;

TEXT MINING;

NANOTECHNOLOGY;

BIBLIOMETRICS; DATA BASE; INFORMATION RETRIEVAL; INFORMATION TECHNOLOGY; INSTRUMENTATION; LITERATURE; NANOTECHNOLOGY; PRIORITY JOURNAL; PUBLICATION; REVIEW; SCANNING ELECTRON MICROSCOPE; SPECTROSCOPY; TAXONOMY; TRANSMISSION ELECTRON MICROSCOPY; X RAY DIFFRACTION;

EID: 34249823657     PISSN: 15734137     EISSN: None     Source Type: Journal    
DOI: 10.2174/157341307780619215     Document Type: Review

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