Colored films produced by electron beam deposition from nanometric TiO2 and Al2O3 pigment powders obtained by modified polymeric precursor method

Dyes and Pigments

Volumn 75, Issue 3, 2007, Pages 693-700

  Bernardi, M I B ^a   De Vicente, F S ^a   Li, M Siu ^a   Hernandes, A C ^a  

^a UNIVERSITY OF SÃO PAULO   (Brazil)

Author keywords

Al2O3; Electron beam deposition; Nanometric pigment powders; Polymeric precursor method; Thick films; TiO2

Indexed keywords

ALUMINA; COLORIMETRY; DEPOSITION; ELECTRON BEAMS; PARTICLE SIZE; PHYSICAL VAPOR DEPOSITION; REFLECTION; REFRACTIVE INDEX; TITANIUM DIOXIDE;

COLORIMETRIC COORDINATES; DIFFUSE REFLECTANCE SPECTRA; ELECTRON BEAM DEPOSITION; POLYMERIC PRECURSOR METHOD; TRANSMISSION SPECTRA ENVELOP METHOD;

PIGMENTS;

COLOR; FILM; PARTICLE SIZE; PIGMENT; POLYMER; POWDER; PRECURSOR; SCANNING ELECTRON MICROSCOPY; SUBSTRATE; THICKNESS; X-RAY ANALYSIS;

EID: 34249790255     PISSN: 01437208     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.dyepig.2006.07.022     Document Type: Article

References (28)

1. Weber I.T., Maciel A.P., Lisboa-Filho P.N., Longo E., Leite E.R., Paiva-Santos C.O., et al. Nano Lett 2 9 (2002) 969-973
2. Bernardi M.I.B., Cava S., Paiva-Santos C.O., Leite E.R., Paskocimas C.A., and Longo E. J Eur Ceram Soc 22 16 (2002) 2911-2919
3. Maciel A.P., Lisboa-Filho P.N., Leite E.R., Paiva-Santos C.O., Schreiner W.H., Manietti Y., et al. J Eur Ceram Soc 23 5 (2003) 707-713
4. Feldmann C. Adv Mater 13 17 (2001) 1301-1303
5. Xie Y., and Yuan C. Mater Res Bull 39 4-5 (2004) 533-543
6. Yin S., Fujishiro Y., Wu J., Aki M., and Sato T. J Mater Process Technol 137 1-3 (2003) 45-48
7. Watson S.S., Beydoun D., Scott J.A., and Amal R. Chem Eng J 95 1-3 (2003) 213-220
8. Campostrini R., Ischia M., and Palmisano L. J Therm Anal Calorim 75 1 (2004) 13-24
9. Phani A.R., and Santucci S. Mater Lett 50 4 (2001) 240-245
10. Wang J., Una S., and Klabunde K. J Appl Catal B Environ 48 2 (2004) 151-154
11. Di Paola A., Garcìa-Lòpez E., Ikeda S., Marci G., Ohtani B., and Palmisano L. Catal Today 75 1-4 (2002) 87-93
12. Carp O., Huisman C.L., and Reller A. Prog Solid State Chem 32 1-2 (2004) 33-177
13. Pati R.K., Ray J.C., and Pramanik P. Mater Lett 44 5 (2000) 299-303
14. Chen G., and Rühle M. Surf Coat Technol 191 2-3 (2005) 263-266
15. Ichinose N. Superfine particle technology (1993), Springer-Verlag, London, UK
16. Pechini M. P. US Patent 3303697; 1967.
17. Quinelato A.L., Longo E., Leite E.R., Bernardi M.I.B., and Varela J.A. J Mater Sci 36 15 (2001) 3825-3830
18. Pontes F.M., Longo E., Rangel J.H., Bernardi M.I.B., Leite E.R., and Varela J.A. Mater Lett 43 5-6 (2000) 249-253
19. Kakihana M., Arima M., Nakamura Y., Yashima M., and Yoshimura M. Chem Mater 11 2 (1999) 438-450
20. De Vicente F.S., Rubo E.A.A., and Li M.S. Revista Brasileira de Aplicações de Vácuo 23 1 (2004) 11-16
21. CIE. Recommendations of uniform color spaces, color difference equations, phychometrics color terms. Supplement no.2 of CIE Publ. No. 15 (E1-1.31) 1971, Bureau Central de la CIE, Paris; 1978.
22. Grosa J.R. Nanostruct Mater 12 (1999) 987-992
23. Bondioli F., and Ferrari A.M. J Am Ceram Soc 83 8 (2000) 2036-2040
24. Mariotto G., Montagna M., and Rossi F. Phys C - Solid State Phys 19 16 (1986) 3029-3037
25. Peng C.H., and Desu S.B. J Am Ceram Soc 77 4 (1944) 929-938
26. Malitson I.H. J Opt Soc Am 55 10 (1965) 1205-1265
27. Eriksson T.S., Hjortsberg A., Niklasson G.A., and Granqvist C.G. Appl Opt 20 15 (1981) 2742-2746
28. Schubert E.F., Passlack M., Hong M., Mannerts J., Opila R.L., Pfeiffer L.N., et al. Appl Phys Lett 64 22 (1994) 2976-2978