Scanning electron microscopic investigations of the microstructure of pseudoelastic NiTi stents;Elektronenmikroskopische untersuchung der mikrostruktur von pseudoelastischen NiTi-stents

Praktische Metallographie/Practical Metallography

Volumn 44, Issue 5, 2007, Pages 208-220

  Frotscher, M ^a   Kroger A ^a   Somsen, Ch ^a   Neuking, K ^a   Steegmuller R ^b   Schußler A ^b   Eggeler, G ^a  

^a RUHR UNIVERSITY BOCHUM   (Germany)

^b Admedes Schuessler GmbH   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

FOCUSED ION BEAMS; NICKEL ALLOYS; SCANNING ELECTRON MICROSCOPY; SHAPE MEMORY EFFECT; SURFACE DEFECTS; TRANSMISSION ELECTRON MICROSCOPY;

FATIGUE LOADING; STENTS SURFACE DEFECTS;

MICROSTRUCTURE;

EID: 34249784841     PISSN: 0032678X     EISSN: None     Source Type: Journal    
DOI: 10.3139/147.100338     Document Type: Article

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