메뉴 건너뛰기




Volumn 27, Issue 1, 2007, Pages 36-47

Automatic instruction-level software-only recovery

Author keywords

Fault recovery; Fault tolerance; Reliability; Software only fault tolerance

Indexed keywords

COMPUTER SOFTWARE SELECTION AND EVALUATION; ERROR DETECTION; PROGRAM DIAGNOSTICS;

EID: 34249775197     PISSN: 02721732     EISSN: None     Source Type: Journal    
DOI: 10.1109/MM.2007.4     Document Type: Article
Times cited : (101)

References (11)
  • 1
    • 1542690244 scopus 로고    scopus 로고
    • Soft Errors in Advanced Semiconductor Devices-Part I: The Three Radiation Sources
    • Mar
    • R.C. Baumann, "Soft Errors in Advanced Semiconductor Devices-Part I: The Three Radiation Sources," IEEE Trans. Device and Materials Reliability, vol. 1, no. 1, Mar. 2001, pp. 17-22.
    • (2001) IEEE Trans. Device and Materials Reliability , vol.1 , Issue.1 , pp. 17-22
    • Baumann, R.C.1
  • 2
    • 0029732376 scopus 로고    scopus 로고
    • Field Testing for Cosmic Ray Soft Errors in Semiconductor Memories
    • Jan
    • T.J. O'Gorman et al., "Field Testing for Cosmic Ray Soft Errors in Semiconductor Memories," IBM J. Research and Development, Jan. 1996, pp. 41-49.
    • (1996) IBM J. Research and Development , pp. 41-49
    • O'Gorman, T.J.1
  • 3
    • 0036931372 scopus 로고    scopus 로고
    • Modeling the Effect of Technology Trends on the Soft Error Rate of Combinational Logic
    • IEEE CS Press
    • P. Shivakumar et al., "Modeling the Effect of Technology Trends on the Soft Error Rate of Combinational Logic," Proc. 2002 Int'l Conf. Dependable Systems and Networks, IEEE CS Press, 2002, pp. 389-399.
    • (2002) Proc. 2002 Int'l Conf. Dependable Systems and Networks , pp. 389-399
    • Shivakumar, P.1
  • 4
    • 26744469636 scopus 로고    scopus 로고
    • IEEE 2002 Reliability Physics Tutorial Notes, Reliability Fundamentals
    • _01.1-121_01.14
    • R.C. Baumann, "Soft Errors in Commercial Semiconductor Technology: Overview and Scaling Trends," IEEE 2002 Reliability Physics Tutorial Notes, Reliability Fundamentals, 2002, pp. 121_01.1-121_01.14.
    • (2002) , pp. 121
    • Baumann, R.C.1
  • 5
    • 29344473319 scopus 로고    scopus 로고
    • Predicting the Number of Fatal Soft Errors in Los Alamos National Laboratory's ASC Q Computer
    • S.E. Michalak et al., "Predicting the Number of Fatal Soft Errors in Los Alamos National Laboratory's ASC Q Computer," IEEE Trans. Device and Materials Reliability, vol. 5, no. 3, 2005, pp. 329-335.
    • (2005) IEEE Trans. Device and Materials Reliability , vol.5 , Issue.3 , pp. 329-335
    • Michalak, S.E.1
  • 6
    • 84944403418 scopus 로고    scopus 로고
    • A Systematic Methodology to Compute the Architectural Vulnerability Factors for a High-Performance Microprocessor
    • IEEE CS Press
    • S.S. Mukherjee et al., "A Systematic Methodology to Compute the Architectural Vulnerability Factors for a High-Performance Microprocessor," Proc. 36th Ann. IEEE/ACM Int'l Symp. Microarchitecture, IEEE CS Press, 2003, pp. 29-42.
    • (2003) Proc. 36th Ann. IEEE/ACM Int'l Symp. Microarchitecture , pp. 29-42
    • Mukherjee, S.S.1
  • 8
    • 85019407607 scopus 로고    scopus 로고
    • G.A. Reis et al., Software-Controlled Fault Tolerance, ACM Trans. Architecture and Code Optimization (TACO), 2. no. 4, Dec 2005, pp. 366-396.
    • G.A. Reis et al., "Software-Controlled Fault Tolerance," ACM Trans. Architecture and Code Optimization (TACO), vol. 2. no. 4, Dec 2005, pp. 366-396.
  • 10
    • 0031339427 scopus 로고    scopus 로고
    • MediaBench: A Tool for Evaluating and Synthesizing Multimedia and Communications Systems
    • IEEE CS Press
    • C. Lee, M. Potkonjak, and W. Mangione-Smith, "MediaBench: A Tool for Evaluating and Synthesizing Multimedia and Communications Systems," Proc. 30th Ann. Int'l Symp. Microarchitecture, IEEE CS Press, 1997, pp. 330-335.
    • (1997) Proc. 30th Ann. Int'l Symp. Microarchitecture , pp. 330-335
    • Lee, C.1    Potkonjak, M.2    Mangione-Smith, W.3
  • 11
    • 4544282186 scopus 로고    scopus 로고
    • Characterizing the Effects of Transient Faults on a High-performance Processor Pipeline
    • IEEE CS Press
    • N.J. Wang et al., "Characterizing the Effects of Transient Faults on a High-performance Processor Pipeline," Proc. 2004 Int'l Conf. Dependable Systems and Networks, IEEE CS Press, 2004, pp. 61-72.
    • (2004) Proc. 2004 Int'l Conf. Dependable Systems and Networks , pp. 61-72
    • Wang, N.J.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.