What is "nano" in the context of a filled dielectric?

Conference Record of IEEE International Symposium on Electrical Insulation

Volumn 2007, Issue , 2007, Pages 273-276

  An, Nie Ling ^a   Boggs, Steven A ^a  

^a UNIVERSITY OF CONNECTICUT   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRICAL TREE INITIATION; NANO FILLERS; STATISTICAL APPROACH;

DIELECTRIC PROPERTIES; POLYMER MATRIX; STATISTICAL METHODS; THREE DIMENSIONAL; TREES (MATHEMATICS);

PLASTICS FILLERS;

EID: 34249728313     PISSN: 01642006     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (4)

1. Keefe, Robert. "Dielectric Behavior of Nanocomposites". Presented to the IEEE Insulated Conductors Committee. Spring 2005.
2. Jiang, G., I. Kuang, and S.A. Boggs. "Critical Parameters for Electrical Tree Formation in XLPE". IEEE Trans. PD-13, No. 2, April 1998. pp. 292-296.
3. Zheng, Z., S. A. Boggs, 'Defect Tolerance of Solid Dielectric Transmission Class', DEIS Feature Article, Vol. 21, NO. 1, Jan/Feb 2005, pp35-41
4. Reif, F. 'Fundamentals of Statistical and Thermal Physics', McGraw-hill Book Company, 1965