Contact angles of submillimeter particles: connecting wettability to nanoscale surface topography

Langmuir

Volumn 23, Issue 10, 2007, Pages 5255-5258

  Forward, Keith M ^a   Moster, Amanda L ^a   Schwartz, Daniel K ^b   Lacks, Daniel J ^a  

^a Case Western Reserve University   (United States)

^b University of Colorado   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

NANOSCALE SURFACE TOPOGRAPHY; PARTICLE SURFACES;

ANGLE MEASUREMENT; OPTICAL MICROSCOPY; PARTICLE SIZE ANALYSIS; POLYETHYLENES; SCANNING ELECTRON MICROSCOPY; SURFACE TOPOGRAPHY; WETTING;

CONTACT ANGLE;

EID: 34249723643     PISSN: 07437463     EISSN: None     Source Type: Journal    
DOI: 10.1021/la700471y     Document Type: Article

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