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Metrologia
Volumn 44, Issue 3, 2007, Pages 167-170
Effect of light scattering from source optics in goniometric diffuse reflectance measurements
Author keywords

[No Author keywords available]
Indexed keywords

ERROR ANALYSIS; LIGHT REFLECTION; LIGHT SOURCES; MEASUREMENT THEORY; REFLECTOMETERS;
EID: 34249713655     PISSN: 00261394     EISSN: 16817575     Source Type: Journal    
DOI: 10.1088/0026-1394/44/3/001     Document Type: Article
Times cited : (7)
References (10)
  • 1
    • 0002131081 scopus 로고
    • Absolute reflectance measurements in the d/0° geometry
    • Budde W and Dodd C X 1970 Absolute reflectance measurements in the d/0° geometry Die Farbe 19 94-102
    • (1970) Die Farbe , vol.19 , pp. 94-102
    • Budde, W.1    Dodd, C.X.2
  • 2
    • 0016627981 scopus 로고
    • Requirements for reflection standards and the measurements of their reflection values
    • Erb W 1975 Requirements for reflection standards and the measurements of their reflection values Appl. Opt. 14 493-9
    • (1975) Appl. Opt. , vol.14 , Issue.2 , pp. 493-499
    • Erb, W.1
  • 3
    • 0347563114 scopus 로고
    • Establishing a scale of directional-hemispherical reflectance factor: The Van den Akker method
    • Venable W H, Hsia J J and Weidner V R 1977 Establishing a scale of directional-hemispherical reflectance factor: the Van den Akker method J. Res. Natl Bur. Stand. 82 29-55
    • (1977) J. Res. Natl Bur. Stand. , vol.82 , pp. 29-55
    • Venable, W.H.1    Hsia, J.J.2    Weidner, V.R.3
  • 4
    • 34249729573 scopus 로고
    • Absolute methods for reflection measurements
    • Comission Internationale de'Eclairage 1979 Absolute methods for reflection measurements Publ. CIE 44 (Vienna: CIE)
    • (1979) Publ. CIE 44
    • Internationale De'Eclairage, C.1
  • 5
    • 0019086997 scopus 로고
    • Computer controlled gonioreflectometer for the measurement of spectral reflection characteristics
    • Erb W 1980 Computer controlled gonioreflectometer for the measurement of spectral reflection characteristics Appl. Opt. 19 3789-94
    • (1980) Appl. Opt. , vol.19 , Issue.22 , pp. 3789-3794
    • Erb, W.1
  • 6
    • 0000580493 scopus 로고    scopus 로고
    • NIST high accuracy reference reflectometer-spectrometer
    • Proctor J E and Barnes P Y 1996 NIST high accuracy reference reflectometer-spectrometer J. Res. Natl Inst. Stand. Technol. 101 619-27
    • (1996) J. Res. Natl Inst. Stand. Technol. , vol.101 , Issue.5 , pp. 619-627
    • Proctor, J.E.1    Barnes, P.Y.2
  • 7
    • 0037223916 scopus 로고    scopus 로고
    • NPL scales for radiance factor and total diffuse reflectance
    • Chunnilall C J, Deadman A J, Crane L and Usadi E 2003 NPL scales for radiance factor and total diffuse reflectance Metrologia 40 S192-5
    • (2003) Metrologia , vol.40 , Issue.1
    • Chunnilall, C.J.1    Deadman, A.J.2    Crane, L.3    Usadi, E.4
  • 8
    • 10944249701 scopus 로고    scopus 로고
    • Gonioreflectometer for measuring spectral diffuse reflectance
    • Nevas S, Manoocheri F and Ikonen E 2004 Gonioreflectometer for measuring spectral diffuse reflectance Appl. Opt. 43 6391-9
    • (2004) Appl. Opt. , vol.43 , Issue.35 , pp. 6391-6399
    • Nevas, S.1    Manoocheri, F.2    Ikonen, E.3
  • 9
    • 33645497963 scopus 로고    scopus 로고
    • New robot-based gonioreflectometer for measuring spectral diffuse reflection
    • Hünerhoff D, Grusemann U and Höpe A 2006 New robot-based gonioreflectometer for measuring spectral diffuse reflection Metrologia 43 S11-6
    • (2006) Metrologia , vol.43 , Issue.2
    • Hünerhoff, D.1    Grusemann, U.2    Höpe, A.3
  • 10
    • 0033045630 scopus 로고    scopus 로고
    • Establishment of absolute diffuse reflectance scales using the NPL reference reflectometer
    • Williams D C 1999 Establishment of absolute diffuse reflectance scales using the NPL reference reflectometer Anal. Chim. Acta 380 165-72
    • (1999) Anal. Chim. Acta , vol.380 , Issue.2-3 , pp. 165-172
    • Williams, D.C.1

* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.