Nanoscale roughness on metal surfaces can increase tip-enhanced raman scattering by an order of magnitude

Nano Letters

Volumn 7, Issue 5, 2007, Pages 1401-1405

  Zhang, Weihua ^a   Cui, Xudong ^a   Yeo, Boon Sian ^a   Schmid, Thomas ^a   Hafner, Christian ^a   Zenobi, Renato ^a  

^a ETH ZURICH   (Switzerland)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; MATHEMATICAL MODELS; MONOLAYERS; RAMAN SCATTERING; RAMAN SPECTROSCOPY; SURFACE ROUGHNESS;

METAL SURFACES; THEORETICAL MODELS; TIP-ENHANCED RAMAN SPECTROSCOPY (TERS);

NANOSTRUCTURED MATERIALS;

EID: 34249701293     PISSN: 15306984     EISSN: None     Source Type: Journal    
DOI: 10.1021/nl070616n     Document Type: Article

References (31)

1. Zhang, W.; Yeo, B.; Schmid, T.; Zenobi, R. J. Phys. Chem. C 2007, 111, 1733.
2. Neacsu, C. C.; Dreyer, J.; Behr, N.; Raschke, M. B. Phys. Rev. B 2006, 73.
3. Domke, K. F.; Zhang, D.; Pettinger, B. J. Am. Chem. Soc. 2006, 128, 14721.
4. Ren, B.; Picardi, G.; Pettinger, B.; Schuster, R.; Ertl, G. Angew. Chem., Int. Ed. 2005, 44, 139.
5. Rasmussen, A.; Deckert, V. J. Roman Spectrosc. 2006, 37, 311.
6. Hartschuh, A.; Sanchez, E. J.; Xie, X. S.; Novotny, L. Phys. Rev. Lett. 2003, 90, 095503.
7. Zayats, A. V. Opt. Commun. 1999, 161, 156.
8. Hayazawa, N.; Inouye, Y.; Sekkat, Z.; Kawata, S. Opt. Commun. 2000, 183, 333.
9. Stöckle, R. M.; Suh, Y. D.; Deckert, V.; Zenobi, R. Chem. Phys. Lett. 2000, 318, 131.
10. Notingher, I.; Elfick, A. J. Phys. Chem. B 2005, 109, 15699.
11. Pettinger, B.; Ren, B.; Picardi, G.; Schuster, R.; Ertl, G. Phys. Rev. Lett. 2004, 92.
12. Jiang, J.; Bosnick, K.; Maillard, M.; Brus, L. J. Phys. Chem. B 2003, 107, 9964.
13. Xu, H. X.; Bjerneld, E. J.; Kall, M.; Borjesson, L. Phys. Rev. Lett. 1999, 83, 4357.
14. Xu, H. X.; Aizpurua, J.; Kall, M.; Apell, P. Phys. Rev. E 2000, 62, 4318.
15. Gersten, J. I.; Nitzan, A. Surf. Sci. 1985, 158, 165.
16. Inoue, M.; Ohtaka, K. J. Phys. Soc. Jpn. 1983, 52, 3853.
17. Zhang, P.; Haslett, T. L.; Douketis, C.; Moskovits, M. Phys. Rev. B 1998, 57, 15513.
18. Tsai, D. P.; Kovacs, J.; Wang, Z. H.; Moskovits, M.; Shalaev, V. M.; Suh. J. S.; Botet, R. Phys. Rev. Lett. 1994, 72, 4149.
19. Kreibig, U.; Voller, M. Optical Properties of Metal Clusters; Springer: Berlin, 1995.
20. Bohren, C. F.; Juffman, D. R. Absorption and Scattering of Light by Small Particles; John Wiley: New York, 1983.
21. Stoller, P.; Jacobsen, V.; Sandoghdar, V. Opt. Lett. 2006, 31, 2474.
22. Iwami, M.; Uehara, Y.; Ushioda, S. Rev. Sci. Instrum. 1998, 69, 4010.
23. Ibe, J. P.; Bey, P. P.; Brandow, S. L.; Brizzolara, R. A.; Burnham, N. A.; Dilella, D. P.; Lee, K. P.; Marrian, C. R. K.; Colton, R. J. J. Vac. Sci. Technol., A 1990, 8, 3570.
24. Wan, L. J.; Terashima, M.; Noda, H.; Osawa, M. J. Phys. Chem. B 2000, 104, 3563.
25. Hafner, C. Post-Modern Electromagnetics Using Intelligient MaXwell Solvers; John Wiley & Sons: New York, 1999.
26. Novotny, L.; Bian, R. X.; Xie, X. S. Phys. Rev. Lett. 1997, 79, 645.
27. Johnson, P. B.; Christy, R. W. Phys. Rev. B 1972, 6, 4370.
28. Hiesgen, R.; Meissner, D. Ultramicroscopy 1992, 42, 1403.
29. Williams, P. M.; Shakesheff, K. M.; Davies, M. C.; Jackson, D. E.; Roberts, C. J.; Tendler, S. J. B. J. Vac. Sci. Technol., B 1996, 14, 1557.
30. Villarrubia, J. S. Surf. Sci. 1994, 321, 287.
31. Kerker, M.; Wang, D. S.; Chew, H. Appl. Opt. 1980, 19, 3373.