Scanning photoemission microscopy of photo-cathode surfaces

2006 IEEE International Vacuum Electronics Conference held jointly with 2006 IEEE International Vacuum Electron Sources, IVEC/IVESC 2006

Volumn , Issue , 2006, Pages 431-432

  Shaw, J L ^a   Yater, J E ^a   Butler, J E ^a   Feldman, D W ^b   Moody, N ^b   O'Shea, P G ^b  

^a NAVAL RESEARCH LABORATORY   (United States)

^b University of Maryland   (United States)

Author keywords

Cold cathode; Emission microscope; Negative electron affinity; Photoemission

Indexed keywords

ELECTRON AFFINITY; LASER BEAMS; MICROSCOPIC EXAMINATION; OPTICAL RESOLVING POWER; PHOTOEMISSION; SEMICONDUCTING GALLIUM ARSENIDE;

COLD CATHODES; EMISSION MICROSCOPE; NEGATIVE ELECTRON AFFINITY; SCANNING PHOTOEMISSION MICROSCOPY;

PHOTOCATHODES;

EID: 34249674422     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (0)