High-power microwave-induced helium plasma at atmospheric pressure for trace element analysis

IEEJ Transactions on Fundamentals and Materials

Volumn 127, Issue 5, 2007, Pages 272-276

  Okamoto, Tetsu ^a   Okamoto, Yukio ^b  

^a USHIO INC   (Japan)

^b TOYO UNIVERSITY   (Japan)

Author keywords

Atmospheric pressure plasma; Atomic emission spectrometry; Detection limit; Excitation temperature; Microwave induced plasma; Okamoto cavity; Trace element analysis

Indexed keywords

ATMOSPHERIC PRESSURE PLASMA; DETECTION LIMITS; EXCITATION TEMPERATURE; MICROWAVE INDUCED PLASMA; OKAMOTO CAVITY;

ATMOSPHERIC PRESSURE; CARRIER CONCENTRATION; IONIC CONDUCTION; MICROWAVES; SOLUTIONS; THERMAL EFFECTS;

HELIUM;

EID: 34249654087     PISSN: 03854205     EISSN: 13475533     Source Type: Journal    
DOI: 10.1541/ieejfms.127.272     Document Type: Article

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