Oxygen content and magnetic properties of SrRuO3-δ thin films

IEEE Transactions on Magnetics

Volumn 43, Issue 6, 2007, Pages 3073-3075

  Sakai, Joe ^a   Ito, Nobuaki ^a   Ito, Shin Ichi ^b   Takahashi, Kenji ^b   Funakubo, Hiroshi ^b  

^a JAPAN ADVANCED INSTITUTE OF SCIENCE AND TECHNOLOGY   (Japan)

^b TOKYO INSTITUTE OF TECHNOLOGY   (Japan)

Author keywords

Coercive force; Non Rutherford elastic resonance scattering (NRERS); Ruthenium compounds; Thin films

Indexed keywords

ANNEALING; COERCIVE FORCE; ELASTIC SCATTERING; MAGNETRON SPUTTERING; RUTHENIUM COMPOUNDS; STOICHIOMETRY;

NON RUTHERFORD ELASTIC RESONANCE SCATTERING (NRERS) METHOD; OXYGEN CONTENT; OXYGEN STOICHIOMETRY;

THIN FILMS;

EID: 34249093086     PISSN: 00189464     EISSN: None     Source Type: Journal    
DOI: 10.1109/TMAG.2007.892569     Document Type: Article

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