Evaluation of mean diameter values using Scherrer equation applied to electron diffraction images

NATO Security through Science Series C: Environmental Security

Volumn , Issue , 2007, Pages 231-237

  Ciupinǎ, Victor ^a   Zamfirescu, Stela ^a   Prodan, Gabriel ^a  

^a OVIDIUS UNIVERSITY   (Romania)

Author keywords

BF TEM; CVD; Lognormal; Nano sized; Polycrystalline; SAED; Scherrer

Indexed keywords

EID: 34249082744     PISSN: 18714668     EISSN: None     Source Type: Book Series    
DOI: 10.1007/978-1-4020-6076-2_15     Document Type: Conference Paper

References (8)

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