Deposition and properties of CdTe nanowires prepared by template replication

Physica Status Solidi (B) Basic Research

Volumn 244, Issue 5, 2007, Pages 1607-1611

  Enculescu, Ionut ^a   Sima, Marian ^a   Enculescu, Monica ^a   Enache, Mihaela ^a   Ion, Lucian ^b   Antobe, Stefan ^b   Neumann, Reinhard ^c  

^a NATIONAL INSTITUTE OF MATERIALS PHYSICS   (Romania)

^b UNIVERSITY OF BUCHAREST   (Romania)

^c GSI HELMHOLTZZENTRUM FÜR SCHWERIONENFORSCHUNG GMBH   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

CADMIUM TELLURIDE; ELECTRON DIFFRACTION; ENERGY DISPERSIVE X RAY ANALYSIS; ENERGY GAP; HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY; II-VI SEMICONDUCTORS; NANOWIRES; REDUCTION; SCANNING ELECTRON MICROSCOPY; X RAY DIFFRACTION ANALYSIS;

DEPOSITION POTENTIAL; ION TRACK MEMBRANES; MORPHOLOGICAL CHARACTERIZATION; REFLECTION SPECTROSCOPY; SCANNING AND TRANSMISSION ELECTRON MICROSCOPY; SELECTED AREA ELECTRON DIFFRACTION; STOICHIOMETRIC COMPOSITIONS; STRUCTURAL MEASUREMENTS;

ELECTROCHEMICAL DEPOSITION;

EID: 34249073676     PISSN: 03701972     EISSN: 15213951     Source Type: Journal    
DOI: 10.1002/pssb.200675109     Document Type: Article

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