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Volumn 159, Issue 1-3, 2007, Pages 81-90

Fast electron and X-ray scattering as a tool to study target's structure

Author keywords

"Dragging" of electrons; Compton scattering; Endohedral atoms; Generalized oscillator strength; Inelastic electron scattering; Intra doublet correlations; Small angle scattering

Indexed keywords

COMPTON SCATTERING; ELECTRONIC STRUCTURE; FULLERENES; INELASTIC SCATTERING; PHOTOIONIZATION; X RAY SCATTERING;

EID: 34249051357     PISSN: 03682048     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.elspec.2007.03.004     Document Type: Article
Times cited : (6)

References (46)
  • 11
    • 19644400590 scopus 로고    scopus 로고
    • and references therein
    • Chen Z., and Msezane A.Z. Phys. Rev. A 70 (2004) 032714 and references therein
    • (2004) Phys. Rev. A , vol.70 , pp. 032714
    • Chen, Z.1    Msezane, A.Z.2
  • 35
    • 34249108665 scopus 로고    scopus 로고
    • M.Ya. Amusia, L.V. Chernysheva, Z. Felfli, A.Z. Msezane, Phys. Rev. A (2007), in press.
  • 41
    • 34249096557 scopus 로고    scopus 로고
    • M.Ya. Amusia, J. Electron Spectrosc. Rel. Phenom. (2007), in press. http://xxx.lanl.gov/abs/physics/0608176.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.