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Volumn 159, Issue 1-3, 2007, Pages 81-90
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Fast electron and X-ray scattering as a tool to study target's structure
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Author keywords
"Dragging" of electrons; Compton scattering; Endohedral atoms; Generalized oscillator strength; Inelastic electron scattering; Intra doublet correlations; Small angle scattering
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Indexed keywords
COMPTON SCATTERING;
ELECTRONIC STRUCTURE;
FULLERENES;
INELASTIC SCATTERING;
PHOTOIONIZATION;
X RAY SCATTERING;
ENDOHEDRAL ATOMS;
GENERALIZED OSCILLATOR STRENGTHS (GOS);
INTRA DOUBLET CORRELATIONS;
SMALL ANGLE SCATTERING;
ELECTRONS;
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EID: 34249051357
PISSN: 03682048
EISSN: None
Source Type: Journal
DOI: 10.1016/j.elspec.2007.03.004 Document Type: Article |
Times cited : (6)
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References (46)
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