Measurement of structure and strain by transversal ultra-high resolution polarisation-sensitive optical coherence tomography

Insight: Non-Destructive Testing and Condition Monitoring

Volumn 49, Issue 5, 2007, Pages 275-278

  Wiesauer, Karin ^a   Pircher, Michael ^b   Götzinger, Erich ^b   Hitzenberger, Christoph K ^b   Engelke, Rainer ^c   Grützner, Gabi ^c   Ahrens, Gisela ^c   Oster, Reinhold ^d   Stifter, David ^a  

^a Upper Austrian Research GmbH   (Austria)

^b MEDICAL UNIVERSITY OF VIENNA   (Austria)

^c MICRO RESIST TECHNOLOGY GMBH   (Germany)

^d EUROCOPTER DEUTSCHLAND GMBH   (France)

Author keywords

[No Author keywords available]

Indexed keywords

ANISOTROPY; GLASS FIBERS; MEMS; NONDESTRUCTIVE EXAMINATION; PHOTORESISTS; STRAIN MEASUREMENT; STRUCTURAL ANALYSIS;

SEMI-TRANSPARENT MATERIALS;

OPTICAL TOMOGRAPHY;

EID: 34248682433     PISSN: 13542575     EISSN: None     Source Type: Journal    
DOI: 10.1784/insi.2007.49.5.275     Document Type: Article

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