Demultiplexers for nanoelectronics constructed from nonlinear tunneling resistors

IEEE Transactions on Nanotechnology

Volumn 6, Issue 3, 2007, Pages 280-290

  Robinett, Warren ^a   Snider, Greg S ^a   Stewart, Duncan R ^a   Straznicky, Joseph ^a   Williams, R Stanley ^a  

^a HEWLETT PACKARD LABORATORIES   (United States)

Author keywords

Demultiplexing; Error correction coding; Nan otechnology; Nonlinear circuits; Resistive circuits; Voltage dividers

Indexed keywords

CODES (SYMBOLS); CURRENT VOLTAGE CHARACTERISTICS; DEMULTIPLEXING; ERROR CORRECTION; NANOTECHNOLOGY; VOLTAGE DIVIDERS;

ERROR CORRECTION CODING; NONLINEAR CIRCUITS; RESISTIVE CIRCUITS; TUNNELING RESISTORS;

RESISTORS;

EID: 34248669023     PISSN: 1536125X     EISSN: None     Source Type: Journal    
DOI: 10.1109/TNANO.2007.893589     Document Type: Article

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