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Volumn 6486, Issue , 2007, Pages

A new wafer level coating technique to reduce the color distribution of LEDs

Author keywords

[No Author keywords available]

Indexed keywords

COATING TECHNIQUES; COLOR; PHOSPHORS; SILICON WAFERS; THICKNESS CONTROL; WAVELENGTH;

EID: 34248666725     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.697972     Document Type: Conference Paper
Times cited : (43)

References (8)
  • 5
    • 42849083595 scopus 로고    scopus 로고
    • R. Mueller-Mach, G. Mueller, M. Krames, H. Höppe, F. Stadler, W. Schnick, T. Juestel, P. Schmidt, Physica Status Solidi (A), Applied Research, 202, Issue 9, p. 1721
    • R. Mueller-Mach, G. Mueller, M. Krames, H. Höppe, F. Stadler, W. Schnick, T. Juestel, P. Schmidt, Physica Status Solidi (A), Applied Research, Vol. 202, Issue 9, p. 1721


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.