Structural characterization of Pb1-xBaxZr0.65Ti 0.35O3 ferroelectric ceramics

Ferroelectrics

Volumn 339, Issue 1 PART 7, 2006, Pages 219-226

  Mastelaro, V R ^a   Doriguetto, A C ^b   Neves, P P ^a   Garcia, D ^c   Lente, M H ^c   Mascarenhas, Y P ^a   Michalowicz, A ^d   Eiras, J A ^c  

^a UNIVERSITY OF SÃO PAULO   (Brazil)

^b FEDERAL UNIVERSITY OF ALFENAS   (Brazil)

^c FEDERAL UNIVERSITY OF SÃO CARLOS   (Brazil)

^d UNIVERSITÉ PARIS EST CRÉTEIL   (France)

Author keywords

ceramic; PBZT; structure; XAS; XRD

Indexed keywords

CERAMIC; PBZT; STRUCTURE; XAS; XRD;

BARIUM; FERROELECTRIC CERAMICS; FERROELECTRICITY; LEAD; MODEL STRUCTURES; RIETVELD METHOD; RIETVELD REFINEMENT; X RAY DIFFRACTION;

PHASE TRANSITIONS;

EID: 34248663055     PISSN: 00150193     EISSN: 15635112     Source Type: Journal    
DOI: 10.1080/00150190600740234     Document Type: Conference Paper

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