Germanium on silicon photodetectors for telecom wavelengths

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 6477, Issue , 2007, Pages

  Vivien, Laurent ^a   Rouvière, Mathieu ^a,b   Le Roux, Xavier ^a   Mangeney, Juliette ^a   Crozat, Paul ^a   Marris Morini, Delphine ^a   Pascal, Daniel ^a   Cassan, Eric ^a   Laval, Suzanne ^a   Damlencourt, Jean François ^c   Melhaoui, Loubna El ^c   Fédéli, Jean Marc ^c  

^a UNIVERSITÉ PARIS SACLAY   (France)

^b STMICROELECTRONICS   (France)

^c CEA LETI   (France)

Author keywords

Germanium on silicon; Metal semiconductor metal; Photodetectors; Pin; Silicon on insulator

Indexed keywords

BANDWIDTH; GERMANIUM; OPTICAL COMMUNICATION; SILICON ON INSULATOR TECHNOLOGY; WAVELENGTH;

GERMANIUM ON SILICON PHOTODETECTORS; METAL SEMICONDUCTOR METAL DEVICES; PIN DIODES; TELECOMMUNICATION WAVELENGTHS;

PHOTODETECTORS;

EID: 34248632828     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.700621     Document Type: Conference Paper

References (9)

1. Graham T. Reed, Nature 427, 595-596 (2004).
2. L.Vivien, S.Lardenois, D.Pascal, S.Laval, E.Cassan, J.L.Cercus, A.Koster, J.M.Fédéli, M.Heitzmann, Applied Physics Letters, 85 (5), 701-703 (2004).
3. D. Marris, L. Vivien, D. Pascal, M. Rouvìere, E. Cassan, A. Lupu, S. Lavai, J.M. Fédéli, L El Melhaoui, Applied Physics Letters87 (2005) 211102
4. L. Colace, G. Masini, F. Galluzzi, G. Assanto, G. Capellini, L. Di Caspare, E. Palange and F. Evangelisti, Appl. Phys. Lett. 72, 3175-3177 (1998).
5. Jutzi, M., Berroth, M., Wöhl, G., Oehme, M., Kasper, E., IEEE Phot. Techn. Lett. 17, 1510-1512 (2005).
6. Rouvière, M., Vivien, L., Le Roux, X., Mangeney, J., Crozat, P., Hoarau, C., Cassan, E., Pascal, D., Laval, S., Fédéli, J.M., Damlencourt, J.F., & Hartmann, J.M., Appl. Phys. Lett. 87 (2005) 231109.
7. Rouvière, M., Halbwax, M., Cercus, J.-L., Cassan, E., Vivien, L., Pascal, D., Heitzmann, M., Hartmann, J.M., Laval, S., Optical Engineering 44, 75402-75406 (2005).
8. J. M. Hartmann, A. Abbadie, A. M. Papon, P. Holliger, G. Rolland, T. Billon, J. M. Fédéli, M. Rouvière, L. Vivien, S. Laval, J. Appl. Phys. 95, 5905-5907 (2004).
9. M. Halbwax, M. Rouviere, Y. Zheng, D. Debarre, L. H. Nguyen, J. L. Cercus, C. Clerc, V. Yam, S. Laval, E. Cassan, D. Bouchier, Optical Materials 27, 822-826 (2005).