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Mathematical and Computer Modelling
Volumn 46, Issue 5-6, 2007, Pages 730-737
Optimal threshold value of failure-rate for leased products with preventive maintenance actions
Author keywords

Leased product; Minimal repair; Preventive maintenance; Threshold value
Indexed keywords

ALGORITHMS; FAILURE ANALYSIS; MATHEMATICAL MODELS; OPTIMIZATION; PREVENTIVE MAINTENANCE; WEIBULL DISTRIBUTION;
EID: 34248585354     PISSN: 08957177     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.mcm.2006.12.001     Document Type: Article
Times cited : (70)
References (12)
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  • 2
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  • 3
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    • Chun, Y.H.1
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    • (1994) Microelectronics and reliability , vol.34 , pp. 529-534
    • Jack, N.1    Dagpunar, J.S.2
  • 5
    • 0035480443 scopus 로고    scopus 로고
    • Optimal preventive-maintenance warranty policy for repairable products
    • Yeh R.H., and Lo H.C. Optimal preventive-maintenance warranty policy for repairable products. European Journal of Operational Research 134 (2001) 59-69
    • (2001) European Journal of Operational Research , vol.134 , pp. 59-69
    • Yeh, R.H.1    Lo, H.C.2
  • 7
    • 0020704538 scopus 로고
    • Analysis of a system with minimal repair and its application to replacement policy
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    • (1983) European Journal of Operational Research , vol.12 , pp. 176-182
    • Nakagawa, T.1    Kowada, M.2
  • 8
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    • Periodic replacement with increasing minimal repair costs at failure
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    • Boland, P.J.1    Proschan, F.2
  • 9
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    • Periodic replacement with minimal repair at failure and general random repair cost for a multi-unit system
    • Sheu S.H. Periodic replacement with minimal repair at failure and general random repair cost for a multi-unit system. Microelectronics Reliability 31 (1991) 1019-1025
    • (1991) Microelectronics Reliability , vol.31 , pp. 1019-1025
    • Sheu, S.H.1
  • 12
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    • Modeling repairable systems with failure rates dependent on age and maintenance
    • Chan J.K., and Shaw L. Modeling repairable systems with failure rates dependent on age and maintenance. IEEE Transactions on Reliability 42 (1993) 566-570
    • (1993) IEEE Transactions on Reliability , vol.42 , pp. 566-570
    • Chan, J.K.1    Shaw, L.2

* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.