Properties of microstructure on amorphous film of rare earth-transition metal alloy for ultrahigh density recording

Journal of Applied Physics

Volumn 101, Issue 9, 2007, Pages

  Murakami, Motoyoshi ^a  

^a PANASONIC CORPORATION   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

AMORPHOUS FILMS; ELECTRIC RESISTANCE; MAGNETIC PROPERTIES; MAGNETOOPTICAL EFFECTS; RARE EARTH ALLOYS; SPUTTERING; THIN FILMS; XENON;

DOMAIN WALL'S MOBILITY; MAGNETO-OPTICAL STORAGE MEDIA; MICROCOLUMNAR STRUCTURE; ULTRAHIGH DENSITY RECORDING;

MICROSTRUCTURE;

EID: 34248578521     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2714672     Document Type: Conference Paper

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