Atomic force and confocal microscopy for the study of cortical cells cultured on silicon wafers

Journal of Materials Science: Materials in Medicine

Volumn 18, Issue 5, 2007, Pages 851-856

  Ma, J ^a   Cui, F Z ^a   Liu, B F ^b   Xu, Q Y ^b  

^a TSINGHUA UNIVERSITY   (China)

^b CAPITAL MEDICAL UNIVERSITY   (China)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; COATINGS; CONFOCAL MICROSCOPY; HYDROFLUORIC ACID; NEURAL NETWORKS; NEUROLOGY; SILICON WAFERS;

CONFOCAL LASER SCANNING MICROSCOPY (CLSM); NANO-RANGE ROUGHNESS (RMS); NEURON CELLS; SILICON SUBSTRATES;

CELL CULTURE;

SILICONE;

ANIMAL CELL; ARTICLE; ATOMIC FORCE MICROSCOPY; BRAIN CELL; BRAIN CORTEX; CELL ADHESION; CONFOCAL MICROSCOPY; CONTROLLED STUDY; EMBRYO; EXTRACELLULAR MATRIX; NERVE CELL CULTURE; NERVE CELL NETWORK; NERVE FIBER GROWTH; NONHUMAN; POROSITY; PRIORITY JOURNAL; RAT;

ANIMALS; BIOCOMPATIBLE MATERIALS; CELL ADHESION; CELLS, CULTURED; CEREBRAL CORTEX; MATERIALS TESTING; MICROSCOPY, ATOMIC FORCE; MICROSCOPY, CONFOCAL; MODELS, NEUROLOGICAL; NERVE NET; NEUROGLIA; NEURONS; RATS; SILICON; SURFACE PROPERTIES;

EID: 34248571537     PISSN: 09574530     EISSN: None     Source Type: Journal    
DOI: 10.1007/s10856-006-0071-4     Document Type: Article

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