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Volumn 40, Issue 9, 2007, Pages 2968-2970

Crystallization of poly(ethylene oxide) patterned by nanoimprint lithography

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL MORPHOLOGY; IMPRINT MOLDS; LOW SURFACE ENERGY RELEASE COATING; SILICON OXIDE SUBSTRATE;

EID: 34248566831     PISSN: 00249297     EISSN: None     Source Type: Journal    
DOI: 10.1021/ma070293h     Document Type: Article
Times cited : (20)

References (45)
  • 5
    • 85035279741 scopus 로고    scopus 로고
    • Ferreiro, V.; Douglas, J. F.; Warren, J. A.; Karim, A. Phys. Rev. E 2002, 65, 0428021-0428024.
    • Ferreiro, V.; Douglas, J. F.; Warren, J. A.; Karim, A. Phys. Rev. E 2002, 65, 0428021-0428024.
  • 9
    • 33745924995 scopus 로고    scopus 로고
    • Steinhart, M.; Göring, P.; Dernaika, H.; Prabhukaran, M.; Gösele, U.; Hempel, E.; Thurn-Albrecht, T. Phys. Rev. Lett. 2006, 97, 0278011-0278014.
    • Steinhart, M.; Göring, P.; Dernaika, H.; Prabhukaran, M.; Gösele, U.; Hempel, E.; Thurn-Albrecht, T. Phys. Rev. Lett. 2006, 97, 0278011-0278014.
  • 41
    • 34248556500 scopus 로고    scopus 로고
    • Certain equipment, instruments, or materials are identified in this paper in order to adequately specify the experimental details. Such identification does not imply recommendation by the National Institute of Standards and Technology nor does it imply the materials are necessarily the best available for the purpose
    • Certain equipment, instruments, or materials are identified in this paper in order to adequately specify the experimental details. Such identification does not imply recommendation by the National Institute of Standards and Technology nor does it imply the materials are necessarily the best available for the purpose.
  • 45
    • 34248519649 scopus 로고    scopus 로고
    • Preliminary studies of films cast on untreated molds indicate that the crystal morphology is unaffected by presence of the SAM layer
    • Preliminary studies of films cast on untreated molds indicate that the crystal morphology is unaffected by presence of the SAM layer.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.