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Volumn 1, Issue , 2005, Pages 330-
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Model-based testing: Challenges ahead
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Author keywords
[No Author keywords available]
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Indexed keywords
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EID: 34248564895
PISSN: 07303157
EISSN: None
Source Type: Conference Proceeding
DOI: 10.1109/COMPSAC.2005.110 Document Type: Conference Paper |
Times cited : (1)
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References (1)
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