Identification of factors that influence defect injection and detection in development of software intensive products

Information and Software Technology

Volumn 49, Issue 7, 2007, Pages 774-789

  Jacobs, Jef ^a   van Moll, Jan ^a,b   Kusters, Rob ^c   Trienekens, Jos ^c   Brombacher, Aarnout ^c  

^a NXP SEMICONDUCTORS   (Netherlands)

^b Sioux Embedded Systems BV   (Netherlands)

^c EINDHOVEN UNIVERSITY OF TECHNOLOGY   (Netherlands)

Author keywords

Card sorting; Cluster analysis; Defect detection factors; Defect injection factors

Indexed keywords

CLUSTER ANALYSIS; DEFECTS; PRODUCT DEVELOPMENT; PROJECT MANAGEMENT; PUBLIC POLICY; SOCIETIES AND INSTITUTIONS;

CARD SORTING; DEFECT DETECTION FACTORS; DEFECT INJECTION FACTORS;

SOFTWARE ENGINEERING;

EID: 34248560956     PISSN: 09505849     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.infsof.2006.09.002     Document Type: Article

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