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Volumn 2, Issue , 2005, Pages 41-42

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Author keywords

[No Author keywords available]

Indexed keywords

FEATURE EXTRACTION; IMAGE RECORDING; MEASUREMENT THEORY;

EID: 34248536513     PISSN: 07303157     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/COMPSAC.2005.140     Document Type: Conference Paper
Times cited : (49)

References (5)
  • 3
    • 34248509580 scopus 로고    scopus 로고
    • I. Daubechies: Ten Lectures on Wavelets, Society for Industrial and Applied Mathematics, Philadelphia 1992.
    • I. Daubechies: Ten Lectures on Wavelets, Society for Industrial and Applied Mathematics, Philadelphia 1992.
  • 5
    • 0035294772 scopus 로고    scopus 로고
    • Brief review of invariant texture analysis methods
    • J. Zhang, T. Tan, Brief review of invariant texture analysis methods, Pattern Recognition 35, 735-747, 2002.
    • (2002) Pattern Recognition , vol.35 , pp. 735-747
    • Zhang, J.1    Tan, T.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.