A defect estimation approach for sequential inspection using a modified Capture-Recapture model

Proceedings - International Computer Software and Applications Conference

Volumn 1, Issue , 2005, Pages 41-46

  Chang, Ching Pao ^a   Lv, Jia Lyn ^a   Chu, Chih Ping ^a  

^a NONE

Author keywords

Capture recapture model; Defect estimation; Inspection; Re inspection model

Indexed keywords

DATA ACQUISITION; QUALITY ASSURANCE; SOFTWARE TESTING;

CAPTURE-RECAPTURE MODEL; DEFECT ESTIMATION; INSPECTION MODELS; RE-INSPECTION MODEL;

COMPUTER SOFTWARE SELECTION AND EVALUATION;

EID: 34248530309     PISSN: 07303157     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/COMPSAC.2005.19     Document Type: Conference Paper

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