How do nanometer scale dislocation traces evolve in the stress anomaly domain of intermetallics?

Applied Physics Letters

Volumn 90, Issue 17, 2007, Pages

  Coupeau, Christophe ^a   Bonneville, Joël ^a  

^a UNIVERSITÉ DE POITIERS   (France)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; NANOTECHNOLOGY; NICKEL COMPOUNDS; POSITIVE TEMPERATURE COEFFICIENT; SINGLE CRYSTALS; SUPERALLOYS; YIELD STRESS;

DISLOCATION VELOCITY; NANOMETER SCALE DISLOCATION; POSITIVE TEMPERATURE DEPENDENCE;

INTERMETALLICS;

EID: 34248529890     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2731436     Document Type: Article

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