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Volumn 43, Issue 3, 2007, Pages 163-164

Vertical-cavity surface-emitting lasers with lateral carrier confinement

Author keywords

[No Author keywords available]

Indexed keywords

CARRIER MOBILITY; ELECTRIC CURRENT CONTROL; HETEROJUNCTIONS; SEMICONDUCTOR QUANTUM WELLS;

EID: 34248382156     PISSN: 00135194     EISSN: None     Source Type: Journal    
DOI: 10.1049/el:20073844     Document Type: Article
Times cited : (10)

References (7)
  • 1
    • 0031130291 scopus 로고    scopus 로고
    • Physical reasons for optical interconnection
    • 0952-5432
    • Miller, D.A.B.: ' Physical reasons for optical interconnection ', Int. J. Optoelectron., 1997, 11, p. 155-168 0952-5432
    • (1997) Int. J. Optoelectron. , vol.11 , pp. 155-168
    • Miller, D.A.B.1
  • 2
    • 0031109215 scopus 로고    scopus 로고
    • Scattering losses from dielectric apertures in vertical-cavity lasers
    • 10.1109/2944.605682 1077-260X
    • Hegblom, E.R., Babic, D.I., Thibeault, B.J., and Coldren, L.A.: ' Scattering losses from dielectric apertures in vertical-cavity lasers ', IEEE J. Sel. Top. Quantum Electron., 1997, 3, p. 379-389 10.1109/2944.605682 1077-260X
    • (1997) IEEE J. Sel. Top. Quantum Electron. , vol.3 , pp. 379-389
    • Hegblom, E.R.1    Babic, D.I.2    Thibeault, B.J.3    Coldren, L.A.4
  • 5
    • 0002694794 scopus 로고
    • Atom diffusion and impurity-induced layer disordering in quantum well III-V semiconductor heterostructures
    • 10.1063/1.341981 0021-8979
    • Deppe, D.G., and Holonyak Jr., N.: ' Atom diffusion and impurity-induced layer disordering in quantum well III-V semiconductor heterostructures ', J. Appl. Phys., 1988, 64, p. 93-113 10.1063/1.341981 0021-8979
    • (1988) J. Appl. Phys. , vol.64 , pp. 93-113
    • Deppe, D.G.1    Holonyak Jr., N.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.