Off-line signature verification using an enhanced modified direction feature with single and multi-classifier approaches

IEEE Computational Intelligence Magazine

Volumn 2, Issue 2, 2007, Pages 18-25

  Armand, Stéphane ^a   Blumenstein, Michael ^a   Muthukkumarasamy, Vallipuram ^a  

^a GRIFFITH UNIVERSITY   (Australia)

Author keywords

[No Author keywords available]

Indexed keywords

BINARY IMAGES; DATABASE SYSTEMS; EDGE DETECTION; ELECTRONIC DOCUMENT IDENTIFICATION SYSTEMS; VERIFICATION;

DOME MODIFICATIONS; MODIFIED DIRECTION FEATURE (MDF); SIGNATURE VERIFICATION;

FEATURE EXTRACTION;

EID: 34248376923     PISSN: 1556603X     EISSN: None     Source Type: Journal    
DOI: 10.1109/MCI.2007.353417     Document Type: Article

References (12)

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