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Volumn 13, Issue 4, 2007, Pages 16-19
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High-k gate stacks point towards digital convergence
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Author keywords
[No Author keywords available]
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Indexed keywords
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EID: 34248365261
PISSN: 1096598X
EISSN: None
Source Type: Trade Journal
DOI: None Document Type: Article |
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Times cited : (1)
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References (0)
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