Resolution of amorphous silicon thin-film transistor instability mechanisms using ambipolar transistors

Applied Physics Letters

Volumn 51, Issue 14, 1987, Pages 1094-1096

  Van Berkel, C ^a   Powell, M J ^a  

^a PHILIPS RESEARCH LABORATORIES   (Netherlands)

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EID: 34248326216     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.98751     Document Type: Article

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