Stylus contact on short wavelength random surfaces: A simulation study

Measurement Science and Technology

Volumn 18, Issue 6, 2007, Pages 1694-1702

  Tian, Ailing ^a,b   Liu, X ^b   Chetwynd, D G ^b   Cai, Zhijian ^b  

^a XI'AN TECHNOLOGICAL UNIVERSITY   (China)

^b UNIVERSITY OF WARWICK   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

ALGORITHMS; COMPUTATIONAL GEOMETRY; COMPUTER SIMULATION; CORRELATION METHODS; MEASUREMENT ERRORS; PARAMETER ESTIMATION;

GAUSSIAN RANDOM SURFACES; GEOMETRICAL CONTACT ALGORITHMS; SURFACE DISTORTION;

SURFACE STRUCTURE;

ALGORITHMS; COMPUTATIONAL GEOMETRY; COMPUTER SIMULATION; CORRELATION METHODS; MEASUREMENT ERRORS; PARAMETER ESTIMATION; SURFACE STRUCTURE;

EID: 34248215048     PISSN: 09570233     EISSN: 13616501     Source Type: Journal    
DOI: 10.1088/0957-0233/18/6/S05     Document Type: Article

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