A new methodology for the on-wafer characterization of RF integrated transformers

IEEE Transactions on Microwave Theory and Techniques

Volumn 55, Issue 5, 2007, Pages 1046-1053

  Cendoya, Iosu ^a   De Nó, Joaquín ^a   Sedano, Beatriz ^a   García Alonso, Andrés ^a   Valderas, Daniel ^a   Gutiérrez, Iñigo ^a  

^a UNIVERSITY OF NAVARRA   (Spain)

Author keywords

Coupling factor; Integrated transformer; Measurement system; Methodology

Indexed keywords

COMPUTATIONAL GEOMETRY; ELECTRIC VARIABLES MEASUREMENT; MEASUREMENT THEORY; TERMINALS (ELECTRIC);

COUPLING FACTORS; INTEGRATED TRANSFORMERS; MEASUREMENT SYSTEMS; METHODOLOGY;

ELECTRIC TRANSFORMERS;

EID: 34248189116     PISSN: 00189480     EISSN: None     Source Type: Journal    
DOI: 10.1109/TMTT.2007.895648     Document Type: Article

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