Two-acceptor levels in the band gap of boron-doped diamond semiconductors analyzed by soft x-ray absorption spectroscopy and DV-Xα calculations

X-Ray Spectrometry

Volumn 36, Issue 3, 2007, Pages 162-166

  Muramatsu, Yasuji ^a   Takebe, Toshihiko ^b   Sawamura, Akitaka ^b   Iihara, Junji ^b   Nanba, Akihiko ^b   Imai, Takahiro ^b   Denlinger, Jonathan D ^c   Perera, Rupert C C ^c  

^a UNIVERSITY OF HYOGO   (Japan)

^b SUMITOMO ELECTRIC INDUSTRIES LTD   (Japan)

^c LAWRENCE BERKELEY NATIONAL LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMS; CHEMICAL SHIFT; DIAMONDS; ENERGY GAP; MOLECULAR ORBITALS; SEMICONDUCTING BORON; X RAY ABSORPTION SPECTROSCOPY;

ACCEPTOR LEVELS; B ATOMS; BORON DOPED DIAMOND; C ATOMS; DOPED DIAMONDS; ELECTRONIC.STRUCTURE; LOWEST UNOCCUPIED MOLECULAR ORBITAL; ORBITALS; SOFT X-RAY ABSORPTION SPECTROSCOPIES; SOFT-X-RAY ABSORPTION;

ELECTRONIC STRUCTURE;

EID: 34248188099     PISSN: 00498246     EISSN: 10974539     Source Type: Journal    
DOI: 10.1002/xrs.959     Document Type: Article

References (13)

1. For example, Kalish R. Diamond Relat. Mater. 2001; 10:1749.
2. Ekimov EA, Sindorov VA, Bauer ED, Mel'nikNN, Curro NJ, Thompson JD, Stishov SM. Nature 2004; 428: 542.
3. Nakamura J, Kabasawa K, Yamada N, Einaga Y, Saito D, Isshiki H, Yugo S, Perera RCC. Phys. Rev., B 2004; 70: 245111.
4. For example, Nordgren J. In New Directions in Research with Third-generation Soft X-Ray Syncrotron Radiation Sources, Schlachter AS, Wuilleumier FJ (eds). Kluwer Academic Publishers: Dordrecht 1994; 189.
5. For example, NEXAFS Spectroscopy, Stöhr J (ed.). Springer-Verlag: Berlin, Heidelburg, New York 1992.
6. For example, X-Ray Absorption Fine Structure, Iwasawa Y (ed.). World Scientific: Singapore, New Jersey, London, HongKong 1996.
7. Iiharaj, Muramatsu Y, Takebe T, Sawamura A, Namba A, Imai T, Denlinger JD, Perera RCC. Jpn. J. Appl. Phys. 2005; 44: 6612.
8. Adachi H, Tsukada M, Satoko C. J. Phys. Soc. Jpn. 1978; 45: 875.
9. Satoko C, Tsukada M, Adachi H. J. Phys. Soc. Jpn. 1978; 45: 1333.
10. Jia JJ, Callcott TA, Yurkas J, Ellis AW, Himpsel FJ, Samant MG, Stöhr J, Ederer DL, Carlisle JA, Hudson EA, Terminello LJ, Shuh DK, Perera RCC. Rev. Sci. Instrum. 1995; 66:1394.
11. Muramatsu Y, Gullikson EM, Perera RCC. Adv. X-Ray Chem. Anal., Jpn. 2004; 35:125.
12. Nakamatsu H. J. Jpn. Soc. Synchrotron Radiat. Res. 2000; 13:10.
13. Sawamura A, Iihara J, Muramatsu Y, Takebe T, Namba A, Imai T. SEI Tech. Rev. 2006; 169: 42, (In Japanese).