Development of a pulsed eddy current system and its characterization

AIP Conference Proceedings

Volumn 894, Issue , 2007, Pages 354-361

  Lee, C ^a,b   Johnson, M J ^c   Nakagawa, N ^a  

^a Iowa State University   (United States)

^b OXFORD INSTRUMENTS PLASMA TECHNOLOGY   (United Kingdom)

^c OPTOMEC INC   (United States)

Author keywords

Instrument characterization; Procedure validation; Pulsed eddy current

Indexed keywords

EID: 34248181049     PISSN: 0094243X     EISSN: 15517616     Source Type: Conference Proceeding    
DOI: 10.1063/1.2717994     Document Type: Conference Paper

References (6)

1. R. A. Smith and G. R. Hugo, Insight 43, 14-25 (2001)
2. S. Giguere, B. A. Lepine, and J. M. S. Dubois, Res. Nondestr. Eval. 13, 119-129 (2001)
3. H. Tsuboi, N. Seshima, I. Sebestyen, J. Pavo, S. Gyimothy, and A. Gasparics, IEEE Trans. Mag. 40, 1330-1333 (2004).
4. F. W. Fu, and J. Bowler, IEEE Trans. Mag. 42, 2029-2037 (2006).
5. C.V. Dodd and W.E. Deeds, J. Appl. Phys. 39, 2829-2838 (1968).
6. C.C. Cheng, C.V. Dodd, and W.E. Deeds, International Journal of Nondestructive Testing 3, 109-130 (1971).