Nanogram amounts of selected rare earth elements measured by AMS

Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

Volumn 259, Issue 1, 2007, Pages 188-193

  Cetina, C ^a   Knies, D L ^b   Grabowski, K S ^b   Berry, A D ^b   Mowery, R L ^b  

^a NOVA RESEARCH INC   (United States)

^b NAVAL RESEARCH LABORATORY   (United States)

Author keywords

Accelerator mass spectrometry; Rare earth elements; Trace elements

Indexed keywords

ION SOURCES; MASS SPECTROMETRY; NANOSTRUCTURED MATERIALS; NEGATIVE IONS; SPUTTERING; TRACE ELEMENTS;

ACCELERATOR MASS SPECTROMETRY; AMS SYSTEMS; DETECTION SYSTEMS; MULTI CATHODE CESIUM SPUTTERING NEGATIVE ION SOURCES;

RARE EARTH ELEMENTS;

EID: 34248152577     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.nimb.2007.01.158     Document Type: Article

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