High resolution x-ray microscope

Applied Physics Letters

Volumn 90, Issue 18, 2007, Pages

  Gary, C K ^a   Park, H ^a   Lombardo, L W ^a   Piestrup, M A ^a   Cremer, J T ^a   Pantell, R H ^b   Dudchik, Y I ^c  

^a ADELPHI TECHNOLOGY INC   (United States)

^b Stanford University   (United States)

^c BELARUSIAN STATE UNIVERSITY   (Belarus)

Author keywords

[No Author keywords available]

Indexed keywords

CARBON; HYDROGEN; IMAGE ANALYSIS; MULTILAYERS; PLASTIC LENSES;

HIGH RESOLUTION X-RAY MICROSCOPE; MULTILAYER OPTIC; SPHERICAL LENSES;

X RAY ANALYSIS;

EID: 34247887688     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2734895     Document Type: Article

References (7)

1. M. A. Piestrup, C. K. Gary, H. Park, J. L. Harris, J. T. Cremer, R. H. Pantell, Y. I. Dudchik, N. N. Kolchevsky, and F. F. Komarov, Appl. Phys. Lett. 86, 131104 (2005).
2. Y. I. Dudchik, N. N. Kolchevsky, F. F. Komarov, M. A. Piestrup, J. T. Cremer, C. K. Gary, H. Park, and A. M. Khounsary, Rev. Sci. Instrum. 75, 4651 (2004).
3. B. Lengeler, C. G. Schroer, M. Richwin, J. Tümmeler, M. Drakopolulos, A. Snigirev, and I. Snigireva, Appl. Phys. Lett. 74, 3924 (1999).
4. Y. Kohmura, K. Okada, A. Takeuchi, H. Takano, Y. Suzuki, T. Ishikawa, T. Ohigashi, and H. Yokosuka, Nucl. Instrum. Methods Phys. Res. A 467-468 881 (2001).
5. A. Snigirev, V. Kohn, I. Snigireva, and B. Lengeler, Nature (London) 384, 49 (1996).
6. R. H. Pantell, J. Feinstein, H. R. Beguristain, M. A. Piestrup, C. K. Gary, and J. T. Cremer, Appl. Opt. 42, 719 (2003).
7. Alerion Biomedical Inc., San Diego, CA 92121.