Surface plasmon enhanced diffraction in cholesteric liquid crystals

Applied Physics Letters

Volumn 90, Issue 18, 2007, Pages

  Hung, Wen Chi ^a   Cheng, Wood Hi ^a   Tsai, Ming Shan ^b   Juan, Yi Chung ^b   Jiang, I Min ^a   Yeh, Pochi ^c  

^a NATIONAL SUN YAT SEN UNIVERSITY   (Taiwan)

^b NATIONAL CHIAYI UNIVERSITY   (Taiwan)

^c University of California   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

APPLIED ELECTRIC FIELD; ENHANCED OPTICAL DIFFRACTION; INDIUM TIN OXIDE;

DIFFRACTION; ELECTRIC POTENTIAL; ELECTRODES; LIGHT POLARIZATION; NANOPARTICLES; SEMICONDUCTING INDIUM COMPOUNDS; SILVER; SURFACE PLASMON RESONANCE;

CHOLESTERIC LIQUID CRYSTALS;

EID: 34247862332     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2735957     Document Type: Article

References (14)

1. J. Muller, C. Sonnichsen, H. von Poschinger, G. von Plessen, T. A. Klar, and J. Feldmann, Appl. Phys. Lett. 81, 171 (2002).
2. Yu Wang, Appl. Phys. Lett. 67, 2759 (1995).
3. R. M. Dickson and L. A. Lyon, J. Phys. Chem. B 104, 6095 (2000).
4. Stefan A. Maier, Mark L. Brongersma, Pieter G. Kik, and Harry A. Atwater, Phys. Rev. B 65, 193408 (2002).
5. H. Ditlbacher, J. R. Krenn, G. Schider, A. Leitner, and F. R. Aussenegg, Appl. Phys. Lett. 81, 1762 (2002).
6. Wataru Nomura, Motoichi Ohtsu, and Takashi Yatsui, Appl. Phys. Lett. 86, 181108 (2005).
7. See, for example, P. Yeh, Optical Waves in Layered Media (Wiley, New York, 1988), p. 332.
8. S. Underwood and P. Mulvaney, Langmuir 10, 3427 (1994).
9. Fabrice Meriaudeau, Todd R. Downey, Ali Passian, Andrew Wig, and Thomas L. Ferrell, Appl. Opt. 37, 8030 (1998).
10. Molly M. Miller and A. Lazarides, J. Phys. Chem. B 109, 21556 (2005).
11. D. Subacius, P. J. Bos, and O. D. Lavrentovich, Appl. Phys. Lett. 71, 1350 (1997).
12. D. Subacius, S. V. Shiyanovskii, Ph. Bos, and O. D. Lavrentovich, Appl. Phys. Lett. 71, 3323 (1997).
13. R. Magnusson and T. K. Gaylord, J. Opt. Soc. Am. 68, 806 (1978).
14. R. Magnusson and T. K. Gaylord, J. Opt. Soc. Am. 68, 809 (1978).