Broadband surface plasmon resonance spectroscopy for determination of refractive-index dispersion of dielectric thin films

Applied Physics Letters

Volumn 90, Issue 18, 2007, Pages

  Qi, Zhi Mei ^a,c   Wei, Mingdeng ^a   Matsuda, Hirofumi ^a   Honma, Itaru ^a   Zhou, Haoshen ^b  

^a JAPAN SCIENCE AND TECHNOLOGY AGENCY   (Japan)

^b NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY AIST   (Japan)

^c INSTITUTE OF ELECTRONICS   (China)

Author keywords

[No Author keywords available]

Indexed keywords

DISPERSIONS; GOLD; REFRACTIVE INDEX; SENSITIVITY ANALYSIS; SURFACE PLASMON RESONANCE; THIN FILMS; WAVELENGTH;

BROADBAND ABSORPTION SPECTROSCOPY; DIELECTRIC LAYERS; SURFACE PLASMON RESONANCE SPECTROSCOPY; THIN GOLD FILMS;

DIELECTRIC FILMS;

EID: 34247859323     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2734898     Document Type: Article

References (11)

1. L.-M. Zhang and D. Uttamchandani, Electron. Lett. 23, 1469 (1988).
2. J. Homola, Sens. Actuators B 41, 207 (1997).
3. A. Hanning, J. Roeraade, J. J. Delrow, and R. C. Jorgenson, Sens. Actuators B 54, 25 (1999).
4. T. Akimoto, S. Sasaki, K. Ikebukuro, and I. Karube, Appl. Opt. 38, 4059 (1999).
5. J. S. Yuk, J. Jung, S. Jung, J. Han, Y. Kim, and K. Ha, Biosens. Bioelectron. 20, 2189 (2005).
6. I. Stemmler, A. Brecht, and G. Gauglitz, Sens. Actuators B 54, 98 (1999).
7. C. Wong, H. Ho, K. Chan, S. Wu, and C. Lin, Opt. Eng. (Bellingham) 44, 124403 (2005).
8. J. J. Saarinen, E. M. Vartiainen, and K. Peiponen, Appl. Phys. Lett. 83, 893 (2003).
9. Z. Qi, I. Honma, and H. Zhou, Appl. Phys. Lett. 90, 011102 (2007).
10. E. D. Palik, Handbook of Optical Constants of Solids (Academic, San Diego, 1998), Vol. 1.
11. http://www.philiplaven.com/p20.html