Effects of temperature on the surface plasmon resonance at a metal-semiconductor interface

Thin Solid Films

Volumn 515, Issue 17, 2007, Pages 6953-6961

  Chiang, H P ^a,b   Chen, C W ^a   Wu, J J ^a   Li, H L ^a   Lin, T Y ^a   Sanchez E J ^c   Leung, P T ^c  

^a NATIONAL TAIWAN OCEAN UNIVERSITY   (Taiwan)

^b INSTITUTE OF PHYSICS   (Taiwan)

^c PORTLAND STATE UNIVERSITY   (United States)

Author keywords

Metal semiconductor junction; Surface plasmon resonance; Temperature effects

Indexed keywords

AMORPHOUS SILICON; COMPUTER SIMULATION; INTERFACES (MATERIALS); SEMICONDUCTOR JUNCTIONS; SILVER; THERMAL EFFECTS;

KRETSCHMANN GEOMETRY; METAL SEMICONDUCTOR JUNCTION;

SURFACE PLASMON RESONANCE;

EID: 34247586612     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2007.02.034     Document Type: Article

References (17)

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