Nanoparticulate origin of intrinsic residual stress in thin films

Acta Materialia

Volumn 55, Issue 10, 2007, Pages 3541-3546

  Guisbiers, G ^a   Van Overschelde, O ^a   Wautelet, M ^a  

^a UNIVERSITY OF MONS   (Belgium)

Author keywords

Grain morphology; Grain size; Nanostructure; Phase transformation; Residual stresses

Indexed keywords

CONDENSATION; GRAIN SIZE AND SHAPE; MELTING POINT; NANOSTRUCTURES; PHASE TRANSITIONS; RELAXATION PROCESSES; RESIDUAL STRESSES;

GRAIN MORPHOLOGY; HOFFMAN'S MODELLING; NANOGRAINS;

THIN FILMS;

EID: 34247573964     PISSN: 13596454     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.actamat.2007.02.003     Document Type: Article

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