The optimized monolithic fault protection circuit for the soft-shutdown behavior of 600V PT-IGBT by employing a new blanking filter

Proceedings of the International Symposium on Power Semiconductor Devices and ICs

Volumn 2006, Issue , 2006, Pages

  Ji, In Hwan ^a   Choi, Young Hwan ^a   Kim, Soo Seong ^b   Oh, Kwang Hoon ^b   Han, Min Koo ^a  

^a Seoul National University   (South Korea)

^b Fairchild Korea Semiconductor Ltd   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; ELECTRIC FILTERS; FAULT TOLERANCE; GATE DIELECTRICS; MOSFET DEVICES; OPTIMIZATION;

BLANKING FILTER; FALSE DETECTION; FAULT PROTECTION CIRCUIT; GATE RESISTOR;

INSULATED GATE BIPOLAR TRANSISTORS (IGBT);

EID: 34247512620     PISSN: 10636854     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (7)

1. K. Ishikawa, et al, "A 600V Driver IC with New Short Protection in Hybrid Electric Vehicle IGBT Inverter System," ISPSD '05, pp. 39-62, 2005
2. Y. Seki, et al, "A new IGET with a monolithic over-current protection circuit," ISPSD '94, pp. 31-35, 1994
3. Z.J. Shen, et al, "Monolithic integration of the vertical IGBT and intelligent protection circuits," ISPSD '96, pp. 295-298, 1996
4. Toshio Takahashi, "IGBT Protection in AC or BLDC Motor Drives," International Rectifier Technical Paper, 2000
5. A. Perez, et al, "An IGBT gate driver integrated circuit with full-bridge output stage and short circuit protections," Semiconductor Conference, CAS 2003 International, Volume 2, pp. 245-248,2003
6. In-Hwan Ji, et al, "A New Fault Protection Circuit of 600V PT-IGBT for the Improved Avalanche Energy Employing the Floating p-well," ISPSD '05, pp. 87-90, 2005
7. Byung-Chul Jeon, et al,"A New Protection Circuit for High-Voltage Current Saturation of LEST", IEEE Electron Device Letters, VOL 26, NO. 3, March, 2005