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Volumn 52, Issue 1, 2007, Pages

Evaluation of MLC leaf positioning using a scanning liquid ionization chamber EPID

Author keywords

[No Author keywords available]

Indexed keywords

ALGORITHMS; AMORPHOUS SILICON; EDGE DETECTION; IMAGING SYSTEMS; IONIZATION CHAMBERS; QUALITY ASSURANCE;

EID: 34247487540     PISSN: 00319155     EISSN: 13616560     Source Type: Journal    
DOI: 10.1088/0031-9155/52/1/N03     Document Type: Article
Times cited : (23)

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