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Volumn 772, Issue 1-2, 2007, Pages 49-66
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Testable flipped SU (5) × U (1)X models
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Author keywords
[No Author keywords available]
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Indexed keywords
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EID: 34247465235
PISSN: 05503213
EISSN: None
Source Type: Journal
DOI: 10.1016/j.nuclphysb.2007.02.025 Document Type: Article |
Times cited : (66)
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References (75)
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