SnOx obtaining by thermal oxidation of nanoscale tin films in the air and its characterization

Thin Solid Films

Volumn 515, Issue 16 SPEC. ISS., 2007, Pages 6350-6355

  Domashevskaya, E P ^a   Ryabtsev, S V ^a   Yurakov, Yu A ^a   Chuvenkova, O A ^a   Kashkarov, V M ^a   Turishchev, S Yu ^a   Kushev, S B ^b   Lukin, A N ^a  

^a VORONEZH STATE UNIVERSITY   (Russian Federation)

^b VORONEZH STATE TECHNICAL UNIVERSITY   (Russian Federation)

Author keywords

Microstructure; Optical properties; Phase composition; Tin oxides; Transmission electron microscopy (TEM); X ray absorption near edge structure (XANES)

Indexed keywords

FILM THICKNESS; MICROSTRUCTURE; NANOSTRUCTURED MATERIALS; OPTICAL PROPERTIES; PHASE COMPOSITION; TIN OXIDES; TRANSMISSION ELECTRON MICROSCOPY; X RAY ABSORPTION SPECTROSCOPY; X RAY PHOTOELECTRON SPECTROSCOPY;

DEFECT STATES; THERMAL OXIDATION; X-RAY ABSORPTION NEAR EDGE STRUCTURE (XANES);

THIN FILMS;

EID: 34247464177     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2006.11.092     Document Type: Article

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