Characterization of the chemical bath deposited In(OH)xSy films: Effect of the growth conditions

Thin Solid Films

Volumn 515, Issue 15 SPEC. ISS., 2007, Pages 6064-6067

  Dedova, T ^a,b   Wienke, J ^a   Goris, M ^a   Krunks, M ^b  

^a TNO   (Netherlands)

^b TALLINN UNIVERSITY OF TECHNOLOGY   (Estonia)

Author keywords

Chemical bath deposition (CBD); Growth rate; In(OH)xSy; Optical band gap; Refractive index; Thin film

Indexed keywords

ENERGY GAP; GROWTH RATE; MORPHOLOGY; REFRACTIVE INDEX;

CHEMICAL BATH DEPOSITION (CBD); OPTICAL BAND GAP;

THIN FILMS;

EID: 34247402905     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2006.12.146     Document Type: Article

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