Nanosecond laser-induced breakdown in pure and Yb3+ doped fused silica

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 6403, Issue , 2007, Pages

  Smith, Arlee V ^a   Do, Binh ^a   Soderlund, Mikko ^b  

^a SANDIA NATIONAL LABORATORIES   (United States)

^b Liekki Corporation   (Finland)

Author keywords

Damage morphology; Fused silica; Optical damage threshold; Ytterbium doped fused silica

Indexed keywords

CRYSTAL DEFECTS; DOPING (ADDITIVES); FIBER AMPLIFIERS; LASER DAMAGE; MORPHOLOGY; YTTERBIUM;

DAMAGE IRRADIANCE; DAMAGE MORPHOLOGY; OPTICAL BREAKDOWN; PULSE DURATION;

FUSED SILICA;

EID: 34247389279     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.696261     Document Type: Conference Paper

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