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1
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84876460307
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ASTM E1790-04; Standard Practice for Near Infrared qualitative analysis, ASTM International, 100 Barr Harbor Drive, PO Box C700, West Conshohocken, PA 19428-2959, United States, 2004
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ASTM E1790-04; Standard Practice for Near Infrared qualitative analysis, ASTM International, 100 Barr Harbor Drive, PO Box C700, West Conshohocken, PA 19428-2959, United States, 2004
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2
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84876475121
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ASTM E2056-04; Standard Practice for Qualifying Spectrometers and Spectrophotometers for Use in Multivariate Analyses, Calibrated Using Surrogate Mixtures, ASTM International, 100 Barr Harbor Drive, PO Box C700, West Conshohocken, PA 19428-2959, United States, 2004
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ASTM E2056-04; Standard Practice for Qualifying Spectrometers and Spectrophotometers for Use in Multivariate Analyses, Calibrated Using Surrogate Mixtures, ASTM International, 100 Barr Harbor Drive, PO Box C700, West Conshohocken, PA 19428-2959, United States, 2004
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3
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84876473400
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USP 28 (2005) General Chapter 〈1119〉 Near-Infrared Spectropho tometry.
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USP 28 (2005) General Chapter 〈1119〉 Near-Infrared Spectropho tometry.
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4
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84876485329
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European Pharmacopoeia 5.0 (2005) 2.2.40 Near-Infrared Spectrophotometry.
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European Pharmacopoeia 5.0 (2005) 2.2.40 Near-Infrared Spectrophotometry.
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5
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84876489528
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ASTM E275-01; Standard practice for describing and measuring performance of ultraviolet, visible and near-infrared spectrophotometers, American Society for Testing Materials, 100 Barr Harbor Drive, West Conshohocken, PA 19428-2959, USA, 2001
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ASTM E275-01; Standard practice for describing and measuring performance of ultraviolet, visible and near-infrared spectrophotometers, American Society for Testing Materials, 100 Barr Harbor Drive, West Conshohocken, PA 19428-2959, USA, 2001
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6
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0034270835
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K.W. Busch, O. Soyemi, D. Rabbe, K. Humphrey, B. Dundee, and M.A. Busch, Appl. Spectrosc. 54(9), 1321-1326 (2000).
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(2000)
Appl. Spectrosc
, vol.54
, Issue.9
, pp. 1321-1326
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Busch, K.W.1
Soyemi, O.2
Rabbe, D.3
Humphrey, K.4
Dundee, B.5
Busch, M.A.6
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7
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17444412707
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S.J. Choquette, D.L. Duewer, L.M. Hanssen, E.A. Early, Appl. Spectrosc. 59 (4), 496-504 (2005).
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(2005)
Appl. Spectrosc
, vol.59
, Issue.4
, pp. 496-504
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Choquette, S.J.1
Duewer, D.L.2
Hanssen, L.M.3
Early, E.A.4
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8
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84876478083
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S. Lowry, B. McCarthy, and J. Hyatt, Thermo Electron Corporation Technical Note 50772.
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S. Lowry, B. McCarthy, and J. Hyatt, Thermo Electron Corporation Technical Note 50772.
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13
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84876467586
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2′, Standard Reference Materials Program, NIST, Gaithersburg, MD, USA.
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2′, Standard Reference Materials Program, NIST, Gaithersburg, MD, USA.
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14
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84876487884
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2 Absorption Reference for 1510 nm to 1540 nm Wavelength Calibration-SRM 2517a.
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2 Absorption Reference for 1510 nm to 1540 nm Wavelength Calibration-SRM 2517a.
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15
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84876497992
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14N Absorption Reference for 1530 nm to 1560 nm Wavelength Calibration-SRM 2519.
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14N Absorption Reference for 1530 nm to 1560 nm Wavelength Calibration-SRM 2519.
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18
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84876459946
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-1, Standard Reference Materials Program, NIST, Gaithersburg, MD, USA.
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-1, Standard Reference Materials Program, NIST, Gaithersburg, MD, USA.
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19
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84876464423
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Obtainable from Nelson Gemological Instruments, 1 Lydhurst Road, Hampstead, London NW3 5PX, UK
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Obtainable from Nelson Gemological Instruments, 1 Lydhurst Road, Hampstead, London NW3 5PX, UK
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20
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0033890891
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S.R. Lowry, J. Hyatt, and W.J. McCarthy, Appl. Spectrosc. 54(3), 450-455(6) (2000).
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(2000)
Appl. Spectrosc
, vol.54
, Issue.3
, pp. 450-455
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Lowry, S.R.1
Hyatt, J.2
McCarthy, W.J.3
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21
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34247371388
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Certificate, National Institute of Standards and Technology
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SRM, Standard Reference Materials Program, NIST, Gaithersburg, MD, USA
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SRM 1920a Certificate, National Institute of Standards and Technology, 'Standard Reference Material 1920a, Near Infrared Reflectance Wavelength Standard from 740 nm to 2000 nm', Standard Reference Materials Program, NIST, Gaithersburg, MD, USA.
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(1920)
Standard Reference Material 1920a, Near Infrared Reflectance Wavelength Standard from 740 nm to 2000 nm
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22
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84876494706
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SRM 2036 Certificate, National Institute of Standards and Technology, Standard Reference Material 2035, Near Infrared Wavelength/ Wavenumber Reflectance Standard, Standard Reference Materials Program, NIST, Gaithersburg, MD, USA.
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SRM 2036 Certificate, National Institute of Standards and Technology, "Standard Reference Material 2035, Near Infrared Wavelength/ Wavenumber Reflectance Standard," Standard Reference Materials Program, NIST, Gaithersburg, MD, USA.
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25
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0004071455
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General Requirements for the Competence of Calibration and Testing Laboratories
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ISO/IEC 17025
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ISO/IEC 17025:2005, General Requirements for the Competence of Calibration and Testing Laboratories.
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(2005)
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26
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0008778498
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Guide 34:2000 General requirements for the competence of reference material producers
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ISO
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ISO Guide 34:2000 General requirements for the competence of reference material producers.
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